Equipment

The equipment of the Physics of Electronic Nanomaterials Group includes four scanning electron microscopes (SEM), an atomic force microscope (AFM), a tunneling microscope (STM), a laser-Raman confocal microscope, and an spectrofluorimeter.

Techniques of cathodoluminescence (CL) in visible and near infrared ranges, electron beam induced current (EBIC), energy dispersive spectroscopy (EDS), electron backscattered diffraction (EBSD) and "in situ" field emission measurements, are implemented in the SEMs.

The STM can work inside the SEM chamber, which enables correlative SEM-STM measurements.

Furnaces for thermal treatments, thermal evaporation and equipment for electrical measurements are also available.